FEI Quanta 3D FIB Scanning Electron Microscope
FEI Quanta 250FEG Environmental Scanning Electron Microscope
FEI Helios 660 Focused Ion Beam-Scanning Electron Microscope
JEOL JXA 8530F Electron Probe Microanalyzer
The JEOL JXA-8530F Plus field emission gun EPMA provides enhanced analytical and imaging capabilities for analysis of inorganic materials.
JEOL ARM 200CF Scanning Transmission Electron Microscope
JEOL GrandARM 300CF AC-Scanning Transmission Electron Microscope
Solving an ergonomic problem to enable safeguards research
Performing nuclear safeguards work safely and developing the next generation workforce are complementary goals of a longstanding program sponsored by the National Nuclear Security Administration’s Office of International Nuclear Safeguards.
Revealing the Distribution of Helium Cavities in a Toughened Tungsten Composite
Different sized helium cavities that form after ion irradiation are unevenly distributed in a ductile-phase toughened tungsten composite.
PNNL @ MARC XII Conference
Researchers from PNNL will be among the 400 scientists from 35 countries at the MARC XII Conference in Kona, Hawaii, April 3–8, 2022, for presentations and discussion on the latest advances in radioanalytical chemistry and its applications.