FEI Quanta 250FEG Environmental Scanning Electron Microscope
Located in RPL | Stewarded by Edgar C. Buck, Nuclear Chemistry and Engineering Group

Understanding beam effects in electrochemical cells is crucial to mitigate possible beam induced artifacts during in situ uranyl precipitation.
Mission
The FEI Quanta 250FEG’s mission is to image a range of radiological materials for research in nuclear forensics, nuclear energy, environmental management, and national security. Materials include, but are not limited to: irradiated fuels, reactor components, and “sludge” from tanks on the Hanford site.
The instrument’s unique environmental chamber also allows for analysis of non-conducting samples and several after-market detectors provide a broader range of imaging possibilities. The scanning/transmission electron microscope detector (STEM) detector, for example, allows users to see through a material rather than simply imaging the surface of it.
Features
- 1-30 keV Environmental scanning electronic microscope, EDAX SSED energy-dispersive detector, electron backscatter diffraction, and wavelength dispersive spectroscopy
- Feed-throughs for electrical for SALVI e-cell
Related publications:
Lui Lili, Maria Sushko, Edgar Buck, Xin Zhang, Libor Kovarik, Zhizhang Shen, Jinhui Tao, Elias Nakouzi, Jun Liu, James De Yoreo. 2019. "Revisiting the Growth Mechanism of Hierarchical Semiconductor Nanostructures: The Role of Secondary Nucleation in Branch Formation." The Journal of Physical Chemistry Letters, 2019, 10, 21, pp. 6827-6834.