Located in APEL | Stewarded by Joshua Silverstein and Jarrod Crum
The JEOL JXA 8530F EPMA is an advanced, high-resolution EPMA, or microprobe. This instrument is designed to make quantitative measurements of the elemental composition of specimens at sub-micron length scales.
Andrea Starr | Pacific Northwest National Laboratory
Mission
The JEOL JXA-8530F Plus field emission gun electron probe microanalyzer (EPMA) provides enhanced analytical and imaging capabilities for analysis of inorganic materials. This non-destructive approach supports quantitative elemental analysis of micron sized features in bulk samples and sub-micron features in thin samples (transmission electron microscopystyle). The instrument is supported by a vast set of microanalysis calibration standards. The wavelength spectrometers are equipped for parts per million sensitivity of trace elements and are capable of measuring elements with atomic mass ≥ Be. This tool is commonly used to study various inorganic materials including geological, ceramic, metal, and glass. This tool can produce quantitative elemental analysis and elemental maps of multiphase materials.
Features
Related publications:
Jarrod Crum, Saehwa Chong, Jacob Peterson, Brian Riley. 2019. "Syntheses, crystal structures, and comparisons of rare-earth oxyapatites Ca2RE8(SiO4)6O2 (RE = La,Nd, Sm, Eu, or Yb) and NaLa9(SiO4)6O2." Acta Crystallographica, E75, 1020-1025.