The Microscopes
Applied Process and Engineering Laboratory (APEL)
- JEOL JSM 5900 Scanning Electron Microscope (SEM)
- JEOL JSM 7001F LV Scanning Electron Microscope (SEM)
- JEOL JXA 8530F Electron Probe Microanalyzer (EPMA)
Materials Science and Technology Laboratory (3410)
- FEI Helios Hydra UX Focused Ion Beam-Scanning Electron Microscope
- FEI Quanta 3D FIB Scanning Electron Microscope (SEM)
- JEOL 7600 Scanning Electron Microscope (SEM)
- JEM-ARM200CF Transmission Electron Microscope (TEM)
- JEOL IT500HRLV Field Emission Scanning Electron Microscope
- JEOL IT800 Field Emission Scanning Electron Microscope
- ORION NanoFab Helium/Neon Ion Microscope
Physical Sciences Laboratory (PSL)
- JEOL 5900LV Scanning Electron Microscope (SEM)
- JEOL JSM-IT200LA Scanning Electron Microscope (SEM)
- Tecnai F20
Radiochemical Processing Laboratory (RPL)
- FEI Helios 660 Focused Ion Beam-Scanning Electron Microscope (FIB-SEM)
- FEI Quanta 250FEG Environmental Scanning Electron Microscope (ESEM)
- JEOL GrandARM 300CF AC-Scanning Transmission Electron Microscope (STEM)
Environmental Molecular Sciences Laboratory (EMSL)
- FEI Tecnai T-12 Cryo-Transmission Electron Microscope (TEM)
- Dynamic Transmission Electron Microscope (TEM) - (available approx. Oct. 2020)
- Focused Ion Beam – Scanning Electron Microscope (SEM)
- Environmental Scanning Electron Microscope and Focused Ion Beam (ESEM)
- Environmental Transmission Electron Microscope (TEM)
- Helium Ion Microscope (HIM)
- Photoemission Electron Microscope (PEEM)
- Aberration-corrected Titan 80-300™ scanning/transmission electron microscope (S/TEM)