Located in PSF | Stewarded by Matthew Olszta and Nicole Overman, Reactor Materials & Mechanical Design Group
The JEOL IT800 Field Emission Scanning Electron Microscope is located in PNNL's Physical Sciences Facility.
Andrea Starr | Pacific Northwest National Laboratory
Mission
The JEOL IT800LV field emission scanning electron microscope is intended to foster analytical characterization and imaging needs across a wide range of research areas. The SEM was added to the PSF microscopy suite in 2021 and is fully equipped with multiple imaging modalities to provide high resolution microstructural, compositional, and crystallographic information. A unique aspect of the microscope is the Oxford Extreme silicon drift detector (SDD), which enables detection and compositional mapping of light elements as low as Lithium.
Features
Detectors