PNNL

FEI Quanta 250FEG Environmental Scanning Electron Microscope

FEI Helios 660 Focused Ion Beam-Scanning Electron Microscope

JEOL JXA 8530F Electron Probe Microanalyzer

The JEOL JXA-8530F Plus field emission gun EPMA provides enhanced analytical and imaging capabilities for analysis of inorganic materials.

JEOL ARM 200CF Scanning Transmission Electron Microscope

JEOL GrandARM 300CF AC-Scanning Transmission Electron Microscope

As Temperatures Rise, Earth's Soil is 'Breathing' More Heavily

The vast reservoir of carbon stored beneath our feet is entering Earth's atmosphere at an increasing rate, according to a new study in the journal Nature.

Dust Busters

Soil Vapor Extraction Performance Assessment

Visual Sample Plan

Visual Sample Plan (VSP) is a software tool that supports the development of a defensible sampling plan based on statistical sampling theory and the statistical analysis of sample results to support confident decision making.

PNNL Staff Members Receive Highest DOE Recognition

The annual Secretary’s Honor Awards recognize federal and contractor employees who have shown exceptional creativity, drive, and commitment to projects that have lasting impact on the Department of Energy's mission.