PNNL

Effect of Iodide on Radiolytic Hydrogen Peroxide Generation

CALiPER Report 24 Supplemented: Photometric Testing, Laboratory Teardowns, and Accelerated Lifetime Testing of OLED Luminaires

Preliminary Evaluation of Removing Used Nuclear Fuel from Shutdown Sites

Transactive Energy Systems Research, Development and Deployment Roadmap

Glass Scientist Wins Exceptional Engineering Achievement Award

Analysis of Technetium Ion Exchange Resin from the 200 West Pump-and-Treat Facility

Adaptive RAS/SPS System Settings for Improving Grid Reliability and Asset Utilization through Predictive Simulation and Controls

Electron Microscopy Characterization of Suspended Solids from Hanford Tank 241-AP-105 Direct Feed Waste

Fellowship Builds Future Leaders for Nuclear Security

PNNL and the National Nuclear Security Administration are building future leaders for nuclear security through the NNSA Graduate Fellowship Program, a hands-on fellowship spanning the nuclear security enterprise.

Focused Ion Beam – Scanning Electron Microscope (Helios 600 - Dual Beam)

The FEI Helios Nanolab DualBeam Focused Ion Beam/Scanning Electron Microscope (SEM), equipped with Energy dispersive X-ray spectroscopy detector (EDX), combines important high-resolution microscopy tools.