PNNL

Abstract

Recent advances in materials data analytics have provided new avenues for determining process-structure-property (PSP) linkages in a variety of materials. Machine learning techniques including few-shot learning have increased the efficiency of classifying microscopy images for the purposes of material characterization. Modifications in segmentation also show potential in improving the accuracy of our current pyCHIP classifier. Replacing previous encoders trained on ImageNet with those trained on microscopy images like MicroNet has initially shown better performance at classifying images of irradiated samples. Additionally, different normalization approaches were tested to show no discernable effect on classification. The Louvain method for community detection is analyzed on a set of irradiated samples with different parameters to determine which proved beneficial under what circumstances. We suggest that microscopy experiments be automated in the future using a combination of these techniques to enable high-throughput analyses.