PNNL

Abstract

Measurement of swipe samples is a critical element of the National Technical Nuclear Forensics (NTNF) mission. A unique, portable, germanium gamma imager (GeGI-s) from PHDS Co may provide complementary information to current techniques for swipe sample screening. The GeGI-s is a modified version of the commercial GeGI-4, a planar HPGe detector, capable of several million counts per second across the whole detector. The GeGI-s detector is a prototype of a commercial off-the-shelf high rate GeGI. The high rate capability allows high-activity samples be placed directly on the face of the detector. Utilizing the high energy resolution and pixelization of the detector, the GeGI-s can generate isotope specific spatial maps of the materials on the swipe sample. To prove this technology is viable for such mapping, the GeGI-s detector response to spatially distributed events must be well characterized. The detection efficiency as a function of location has been characterized to understand the non-uniformities presented as a collimated photon beam was rastered vertically and horizontally across the face of the detector. The detection efficiency as a function of location has been characterized to understand the non-uniformities presented as a collimated photon beam was rastered vertically and horizontally across the face of the detector. The response was found to be primarily uniform and symmetric, however two causes of non-uniformity were found. Both of these causes can ultimately be corrected for in off-line data analysis.