PNNL

Abstract

This note describes an approach for estimating and comparing rates or thresholds for x-ray induced specimen damage during surface analysis. The method uses a common reference material to compare x-ray damage rates reported in the literature and in publications to the rates of damage that may occur on a specific instrument. Although the method makes several assumptions that are only partially valid, results from a few damage data-sets appear acceptably consistent when comparing estimates to a time for 10% damage or signal change.