Intensity Artifacts in Gas Phase FTIR Spectroscopy: Focus on the Aperture

October 1, 2001

Conference Paper

Intensity Artifacts in Gas Phase FTIR Spectroscopy: Focus on the Aperture

Abstract

Two FTIR intensity artifacts are observed: 1) the warm annulus of the aperture seen by the detector resulted in distorted line shapes and intensities in the fingerprint region, and 2) light reflected off the aperture was double modulated by the interferometer producing a 2f alias. Corrections to remove these anomalies are discussed.

Revised: May 3, 2004 | Published: October 1, 2001

Citation

Sharpe S.W., R.L. Sams, T.J. Johnson, and P.M. Chu. 2001. Intensity Artifacts in Gas Phase FTIR Spectroscopy: Focus on the Aperture. In Fourier Transform Spectroscopy, 2001. Trends in Optics and Photonics, 51, 123-127. Washington, District Of Columbia:Optical Society of America. PNNL-SA-33754.