PNNL

Abstract

This review examines the characterization challenges inherently associated with understanding nanomaterials and how surface characterization methods can help meet those challenges. In parts of the research community, there is growing recognition that many studies and published reports on the properties and behaviors of nanomaterials have involved inadequate characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. As the importance of nanomaterials in fundamental research and technological applications increases, it is necessary for researchers to recognize the challenges associated with reproducible materials synthesis, maintaining desired materials properties during handling and processing, and the dynamic nature of nanomaterials, especially nanoparticles. Researchers also need to understand how characterization approaches (surface and otherwise) can be used to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. The types of information that can be provided by traditional surface sensitive analysis methods (including X-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy and secondary ion mass spectroscopy) and less common or evolving surface sensitive methods (e.g., nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) are discussed and various of their use in nanomaterial research are presented.