May 23, 1996
Journal Article

A Photoelectron Spectroscopic Study of Small Silicon Oxide Clusters: SiO2, Si2O3, and Si2O4

Abstract

We present an anion protoelectron spectroscopic study of SiO2, Si2O3, and Si2O4. We obtained the photoelectron spectra of these small silicon oxide anion clusters at 4.66 eV photon energy.

Revised: January 9, 2019 | Published: May 23, 1996

Citation

Wang L., H. Wu, S.R. Desai, J. Fan, and S.D. Colson. 1996. A Photoelectron Spectroscopic Study of Small Silicon Oxide Clusters: SiO2, Si2O3, and Si2O4. Journal of Physical Chemistry A 100, no. 21:8697-8700. PNL-SA-27180. doi:10.1021/jp9602538