June 15, 2008
Journal Article

A method for Removing Surface Contamination on Ultra-pure Copper Spectrometer Components

Abstract

Spectrometers for the lowest-level radiometric measurements require materials of extreme radiopurity. Measurements of rare nuclear decays, e.g. neutrinoless double-beta decay, can require construction and shielding materials with bulk radiopurity reaching one micro-Becquerel per kilogram or less. When such extreme material purity is achieved, surface contamination, particularly solid daughters in the natural radon decay chains, can become the limiting background. High-purity copper is an important material for ultra-low-background spectrometers and thus is the focus of this work. A method for removing surface contamination at very low levels without attacking the bulk material is described. An assay method using a low-background proportional counter made of the material under examination is employed, and the resulting preliminary result of achievable surface contamination levels is presented.

Revised: August 13, 2008 | Published: June 15, 2008

Citation

Hoppe E.W., A. Seifert, C.E. Aalseth, A.R. Day, O.T. Farmer, T.W. Hossbach, and J.I. McIntyre, et al. 2008. A method for Removing Surface Contamination on Ultra-pure Copper Spectrometer Components. Journal of Radioanalytical and Nuclear Chemistry 276, no. 3:645-650. PNNL-SA-49352. doi:10.1007/s10967-008-0612-z