The feasibility of using Electric field enhanced oxidation (EFEO) to fabricate metal-oxide nanowires for sensing toxic gases was investigated. The effects of fabrication parameters such as film thickness, ambient relative humidity, atomic force microscope (AFM) tip bias voltage, force, scan speed and number of scans on the growth of nanowires were determined. The chemical composition of indium-oxide nanowires was verified using Auger electron spectroscopy. It was found that oxygen to indium ration was 1.69, 1.72, 1.71 and 1.84 at depths of 0, 1.3, 2.5, and 3.8 nm, which was near the 1.5:1 expected for stoichiometric indium-oxide film. Future work will include characterizing the electrical and gas sensing properties of the metal-oxide nanowires.
Revised: June 9, 2010 |
Published: January 2, 2007
Citation
Devineni D.P., S. Stormo, W. Kempf, J. Schenkel, R. Behanan, A.S. Lea, and D.W. Galipeau. 2007.Metal-oxide Nanowires for Toxic Gas Detection. In Nanotech 2005, edited by M Laudon and BF Romanowicz, 2, 519-522. Danville, California:Nano Science and Technology Institute (NSTI).PNNL-SA-52754.