Alpha-Fe2O3 and c-CeO2 thin films have been epitaxially grown on alpha-Al2O3 and yttria- stabilized c-ZrO2 substrates, respectively, by oxygen plasma assisted molecular beam epitaxy (OPA-MBE). The interface structural features between the films and the substrates were characterized by high resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), Rutherford backscattering spectrometry (RBS), and x-ray diffraction (XRD). For the two systems studied, the interfaces are similarly characterized by coherent regions that are separated by misfit dislocations periodically distributed along the interface. These results will be presented along with the results from molecular dynamics (MD) simulations of these interfaces.
Revised: October 7, 2011 |
Published: August 1, 2002
Citation
Wang C.M., S. Thevuthasan, F. Gao, V. Shutthanandan, D.E. McCready, S.A. Chambers, and C.H. Peden. 2002.HRTEM Characterization of Interface Between Iso-Structural Thin Solid Film and Substrate.Microscopy and Microanalysis 8, no. Suppl S02:1160-1161.PNNL-SA-35973.