PNNL

Abstract

The quest to discover a dilute magnetic semiconductor which is ferromagnetic at room temperature has led to extensive research on doped semiconducting oxides. However, the wide range of reported properties has raised doubts regarding the presence of intrinsic ferromagnetism in these materials. Here we explore the origin of ferromagnetism in epitaxial Co:ZnO thin films, which are paramagnetic but become weakly ferromagnetic (~0.05 µB/Co) after annealing in Zn vapor to introduce interstitial Zn. Conventional bulk materials characterization techniques indicate no phase segregation or Co reduction has occurred. However, x-ray photoelectron spectroscopy sputter depth profiling clearly indicates the presence of Co(0) in the Zn-treated films; x-ray absorption spectroscopy is utilized to identify the secondary phase as ferromagnetic CoZn (1.5 µB/Co, TC ~ 400 – 450 K). This work demonstrates that the potential for ferromagnetic secondary phases in doped oxides must be thoroughly discounted, through painstaking materials characterization, before claims of intrinsic ferromagnetism can be made.