5% Co-doped cuprous oxide dilute magnetic semiconductor (DMS) cluster film composed of crystalline nanoclusters in the range of ~ 4.2 nm average crystallite size, prepared using sputtering-aggregation technique is found to be ferromagnetic at 400 K with a coercivity of 29 Oe. With the increase in average crystallite size from 4.2 nm to 8 nm, the coercivity increased, whereas the saturation magnetization was achieved at 3 KOe field in both cases. Cu2O phase is observed from the cluster film deposited on the Si wafer when analyzed using XRD. Co in Cu2O host reveals a +2 oxidation state via XPS measurements. Positive magneto resistance (MR) data from the sample exhibits a temperature dependent decrease.
Revised: April 7, 2011 |
Published: January 3, 2007
Citation
Antony J., Y. Qiang, F. Muhammad, D. Meyer, D.E. McCready, and M.H. Engelhard. 2007.Ferromagnetic Semiconductor Nanoclusters: Co-doped Cu2O.Applied Physics Letters 90, no. 1:art. no. 013106 (3 pages).PNNL-SA-52662.doi:10.1063/1.2429018