May 6, 2002
Conference Paper

Experimental and Computer Simulation Studies of Defects and Ion-Solid Interactions in Silicon Carbide

Abstract

The integration of experimental and computer simulation studies is providing atomic-level understanding of irradiation-damage processes in silicon carbide. Density functional theory is used to determine the energetics of defect formation. Molecular dynamics methods are used to study both the energy dependence of defect production and the effects of cascade overlap processes. The accumulation of damage on both the Si and C sublattices has been determined experimentally for a range of ions. The consistent agreement of the experimental and computational results provides an atomic-level interpretation of experimentally observed features.

Revised: May 20, 2004 | Published: May 6, 2002

Citation

Weber W.J., F. Gao, W. Jiang, and R. Devanathan. 2002. Experimental and Computer Simulation Studies of Defects and Ion-Solid Interactions in Silicon Carbide. In Silicon Carbide and Related Materials 2001, Materials Science Forum, edited by S. Yoshida, S. Nishino, H. Harima, and T. Kimoto, 389-393, 875-878. Uetikon-Zuerich:Trans Tech Publications Ltd. PNNL-SA-35343.