January 13, 2023
Journal Article

Deep Learning for Electron and Scanning Probe Microscopy: From Materials Design to Atomic Fabrication

Abstract

Invited perspective article reviewing the state of the art in artificial intelligence for electron and scanning probe microscopy.

Published: January 13, 2023

Citation

Kalinin S.V., M. Ziatdinov, S.R. Spurgeon, C. Ophus, E.A. Stach, T. Susi, and J. Agar, et al. 2022. Deep Learning for Electron and Scanning Probe Microscopy: From Materials Design to Atomic Fabrication. MRS Bulletin 47, no. 9:931-939. PNNL-SA-171109. doi:10.1557/s43577-022-00413-3

Research topics

Chemistry