Instrument

JEOL JSM 7001F/TTLS LV Scanning Electron Microscope

Located in APEL | Stewarded by Jarrod Crum, Radiological Materials Group

Researcher Joshua Silverstein operates the JEOL JSM 7001F/TTLS LV Scanning Electron Microscope (SEM) located in APEL.

Researcher Joshua Silverstein operates the JEOL JSM 7001F/TTLS LV Scanning Electron Microscope (SEM) located in APEL. 

Andrea Starr | Pacific Northwest National Laboratory

Mission

The JEOL JSM 7001F/TTLS LV scanning electron microscope (SEM) provides micron-scale materials characterization in support of solid oxide fuel research. Its advanced, high-resolution SEM is optimized for micro-analysis of non-conducting specimens, such as oxide ceramics and glasses, which can be done routinely without having to coat them. Researchers use this particular instrument when wanting to compare individual phases within a material.

Features 

  • Field emission gun
  • Secondary electron detector
  • Retractable, short-working distance, diode-based backscatter electron (BSE) detector
  • Diode-based BSE detector for low-vacuum operation 
  • In-lens scanning electron and BSE detectors
  • Scanning transmission electron microscope detector
  • Bruker system for energy-dispersive X-ray spectroscopy and electron backscatter diffraction (dual 60mm2 energy-dispersive X-ray spectroscopy detectors)
  • Low-vacuum operation up to 50 Pa; switch back and forth between LV and HV mode without having to vent the chamber

Related publications:

Nathan Canfield, John Hardy, Christopher Coyle, Jeffry Stevenson. 2019. "EBSD Analysis of Undesired Phase Development in Solid Oxide Fuel Cell (SOFC) Lanthanum Strontium Manganese Oxide (LSM) / 8 mol% Yttrium Zirconium Oxide (8YSZ) Cathodes During Long-Term Thermal Anneal." Microscopy and Microanalysis, Vol 25, Supplement S2.