Instrument

JEOL JSM 5900 Scanning Electron Microscope

Located in APEL | Stewarded by Jarrod Crum, Radiological Materials Group

SEM in APEL

The JEOL JSM 5900 is a basic SEM useful for micro-analysis of specimens at 10kx magnification and lower. As a multi-user instrument, staff can request to be trained and can use it as needed to support their project.  

Andrea Starr | Pacific Northwest National Laboratory

Mission

The JEOL JSM 5900 is a basic scanning electron microscope useful for micro-analysis of specimens at 10 kx or less magnification. As a multi-user instrument, staff can request to be trained in its use to support their project, as needed. 

Features

  • Tungsten filament gun
  • Secondary electron detector
  • REBEKA backscatter electron detector; YAG scintillator
  • Energy-dispersive x-ray spectroscopy (EDS) system
  • 4PI image and EDS acquisition system
  • Custom-made sample exchange air-lock for air-sensitive specimens

Research topics

Environmental Management