PNNL

Mission

The JEOL 5900LV Scanning Electron Microscope's (SEM) mission is to provide researchers with initial observations of conductive and non-conductive materials at lower magnification (<10,000x). Its low-vacuum capability means non-conductive samples don’t require a coating for observation, and its energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS) capacity allow for chemical analysis of samples, with the ability to detect trace elements. Given its ease of use, this tireless machine is ideal for scoping trials and initial evaluation of samples that could potentially experience beam damage during analysis.

Features 

• LV capable, scanning electron, backscattered electron, Oxford EDS/WDS
• Microstructural evaluations and chemical analysis using EDS/WDS at magnification up to ~10 kx, uncoated non-conductive samples in LV mode for BSE imaging

Related publications:

Zhan Xiaowen, Jonathan Sepulveda, Xiaochuan Lu, Jeff Bonnett, Nathan Canfield, David Reed, Vincent Sprenkle, Guosheng Li. 2020. "Elucidating the role of anionic chemistry towards high-rate intermediate-temperature Na-metal halide batteries." Energy Storage Materials, Vol. 24, pp 177-187.