PNNL

Abstract

One of the key challenges for many imaging characterization methods is in preparing samples. For instance, TEM sample preparation for complex structures or soft materials is currently time consuming and expensive. Improving the throughput and decreasing the cost of key technologies such as focused ion beam (FIB) and cryo-ultramicrotoming sample preparation would aid in accelerating nanoscale research in soft materials, complex structures and at the intersection of biology and nanotechnology.