PNNL

Abstract

XPS Spectrum have been obtained from eleven metals in the third row of transition elements using a Quantum 2000 Scanning ESCA Microprobe. The metals analyzed include La, Hf, Ta, W, Re, Ir, Pt, Au, Tl, Pb, and Bi. Each sample was Ar> {+} ion etched before XPS analysis to remove any surface contamination and/or oxide. The spectrum include standard survey scans and high energy resolution scans of the photoelectron peaks, as well as selected x-ray induced Auger peaks. Each spectrum was collected using a 100 um monochromatic Al Ka x-ray beam scanned over a 1.5 mm x 0.2 mm area of each sample. Survey scans were collected using an 58.7 eV pass energy, while high energy resolution scans were collected using a 23.5 eV pass energy.