Self-assembled Cu2O nano-dots have been synthesized on single crystal SrTiO3 substrates using oxygen-plasma assisted molecular beam epitaxy (OPA-MBE), and characterized with a number of techniques including atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), and scanning auger microscopy (SAM). It was found that similar to conventional semiconductor systems the growth of Cu2O nano-dots underwent shape/size transformation of Cu2O/SrTiO3 may differ from those of semiconductors.
Revised: January 12, 2012 |
Published: February 1, 2001
Citation
Liang Y., A.S. Lea, D.E. McCready, and P. Meethunkij. 2001.Synthesis and Characterization of Self-Assembled Cu2O Nano-Dots. In State-of-the-art application of surface and interface analysis methods to environmental material interactions: in honor of James E. Castle's 65th year, proceedings of the international symposium held from March 26-27, 2001, in Washington. Proceedings -- Electrochemical Society, edited by D.R. Baer, C.R. Clayton, G.P. Halada, G.D. David, 2001, 125-133. Pennington, New Jersey:The Electrochemical Society.PNNL-SA-34538.