May 14, 2019
Journal Article

In situ transmission electron microscopy investigation on [c + a] slip in Mg

Abstract

Recent molecular dynamics simulations revealed that dislocations in Mg were prone to dissociation on the basal plane, thus becoming sessile. Basal dissociation of dislocations is significant because it is a major factor in the limited ductility and high work-hardening in Mg. We report an in situ transmission electron microscopy study of the deformation process using an H-bar-shaped thin foil of Mg single crystal designed to facilitate slip, observe dislocation activity, and establish the validity of the largely immobile dislocations caused by the predicted basal dissociation. In addition, through detailed observations on the fine movement of some dislocations, it was revealed that limited bowing out movement for some non-basal portions of dislocations was possible; under certain circumstances, i.e., through attraction and reaction between two dislocations on the same pyramidal plane, at least portions of the sessile configuration were observed to be reversed into a glissile one.

Revised: December 17, 2020 | Published: May 14, 2019

Citation

Zhang D., L. Jiang, X. Wang, I.J. Beyerlein, A.M. Minor, J.M. Schoenung, and S. Mahajan, et al. 2019. In situ transmission electron microscopy investigation on [c + a] slip in Mg. Journal of Materials Research 34, no. 9:1499-1508. PNNL-SA-147636. doi:10.1557/jmr.2018.487