October 1, 2016
Journal Article

In situ Observation of Shear-Driven Amorphization in Silicon Crystals

Abstract

Amorphous materials have attracted great interest in the scientific and technological fields. An amorphous solid usually forms under the externally driven conditions of melt-quenching, irradiation and severe mechanical deformation. However, its dynamic formation process remains elusive. Here we report the in situ atomic-scale observation of dynamic amorphization processes during mechanical straining of nanoscale silicon crystals by high resolution transmission electron microscopy (HRTEM). We observe the shear-driven amorphization (SDA) occurring in a dominant shear band. The SDA involves a sequence of processes starting with the shear-induced diamond-cubic to diamond-hexagonal phase transition that is followed by dislocation nucleation and accumulation in the newly formed phase, leading to the formation of amorphous silicon. The SDA formation through diamond-hexagonal phase is rationalized by its structural conformity with the order in the paracrystalline amorphous silicon, which maybe widely applied to diamond-cubic materials. Besides, the activation of SDA is orientation-dependent through the competition between full dislocation nucleation and partial gliding.

Revised: March 10, 2020 | Published: October 1, 2016

Citation

He Y., L. Zhong, F. Fan, C.M. Wang, T. Zhu, and S.X. Mao. 2016. In situ Observation of Shear-Driven Amorphization in Silicon Crystals. Nature Nanotechnology 11, no. 10:866-871. PNNL-SA-114344. doi:10.1038/NNANO.2016.166