March 1, 2014
Journal Article

Scanning ARM Cloud Radars Part I: Operational Sampling Strategies

Abstract

Probing clouds in three-dimensions has never been done with scanning millimeter-wavelength (cloud) radars in a continuous operating environment. The acquisition of scanning cloud radars by the Atmospheric Radiation Measurement (ARM) program and research institutions around the world generate the need for developing operational scan strategies for cloud radars. Here, the first generation of sampling strategies for the Scanning ARM Cloud Radars (SACRs) is discussed. These scan strategies are designed to address the scientific objectives of the ARM program, however, they introduce an initial framework for operational scanning cloud radars. While the weather community uses scan strategies that are based on a sequence of scans at constant elevations, the SACRs scan strategies are based on a sequence of scans at constant azimuth. This is attributed to the cloud properties that are vastly different for rain and snow shafts that are the primary target of precipitation radars. A “cloud surveillance” scan strategy is introduced (HS-RHI) based on a sequence of horizon-to-horizon Range Height Indicator (RHI) scans that sample the hemispherical sky (HS). The HS-RHI scan strategy is repeated every 30 min to provide a static view of the cloud conditions around the SACR location. Between HS-RHI scan strategies other scan strategies are introduced depending on the cloud conditions. The SACRs are pointing vertically in the case of measurable precipitation at the ground. The radar reflectivities are corrected for water vapor attenuation and non-meteorological detection are removed. A hydrometeor detection mask is introduced based on the difference of cloud and noise statistics is discussed.

Revised: September 23, 2014 | Published: March 1, 2014

Citation

Kollias P., N. Bharadwaj, K.B. Widener, I. Jo, and K. Johnson. 2014. Scanning ARM Cloud Radars Part I: Operational Sampling Strategies. Journal of Atmospheric and Oceanic Technology 31, no. 3:569–582. PNNL-SA-100006. doi:10.1175/JTECH-D-13-00044.1