PNNL

Abstract

Reflectance spectroscopy for sample identification has advanced greatly in terms automation by removing the plaguing necessity of sample preparation; automated instruments in the laboratory, in the field and at the process line have made “point and shoot” operation readily accessible, in some instances with standoff detection. For successful identification, however, it is imperative to have reference libraries that are well calibrated not only on the wavelength axis, but on the reflectance axis as well. Ideally, with proper calibration such libraries would be portable to other systems.