Damage accumulation in argon-irradiated SrTiO3 single crystals has been studied by using combination of Rutherford Backscattering/Channeling (RBS/C), High Resolution Transmission Electron Microscopy (HRTEM) and High Resolution X-Ray Diffraction (HRXRD) techniques. The RBS/C spectra were fitted using McChasy, a Monte Carlo simulation code allowing the quantitative analysis of amorphous-like and dislocation-like types of defects. The results were interpreted by using a Multi-Step Damage Accumulation model which assumes, that the damage accumulation occurs in a series of structural transformations, the defect transformations are triggered by a stress caused by formation of a free volume in the irradiated crystal. This assumption has been confirmed by High Resolution Transmission Electron Microscopy and High Resolution X-Ray Diffraction analysis.
Revised: July 25, 2020 |
Published: May 14, 2013
Citation
Jagielski J., P.A. Jozwik, I. Jozwik Biala, L. Kovarik, B.W. Arey, J. Gaca, and W. Jiang. 2013.RBS/C, HRTEM and HRXRD study of damage accumulation in irradiated SrTiO3.Radiation Effects and Defects in Solids 168, no. 6:442-449.PNNL-SA-88792.doi:10.1080/10420150.2013.787796