December 4, 2017
Conference Paper

Performance and Microstructure of a Novel Cr-Getter Material with LSCF-based Cells in a Generic Stack Test Fixture

Abstract

In addition to developing passive means for Cr mitigation via coatings, Pacific Northwest National Laboratory has teamed up with the University of Connecticut to adopt an active approach by employing a novel Cr-getter material in the system. In this work, validation of the novel Cr-getter was conducted using cells in a generic stack test condition with humidified air and coated metallic interconnect. Two Cr-getter locations were investigated: one upstream and one “on cell.” Pre-oxidized AISI 441 metal stripes were used as Cr source. Three single cell tests were conducted at 800oC in constant current mode for 1000h with periodic stops for measurement of impedance and IV: a baseline cell, a cell with Cr source and getter, and a cell with Cr source but no getter. Results showed that the cell with Cr-getter degraded much slower (11.5% kh-1) than the baseline (15.3% kh-1) and the cell without the getter (56% kh-1).

Revised: April 18, 2018 | Published: December 4, 2017

Citation

Chou Y., J. Choi, J.W. Stevenson, C. Liang, B. Hu, W. Rodriguez, and A. Aphale, et al. 2017. Performance and Microstructure of a Novel Cr-Getter Material with LSCF-based Cells in a Generic Stack Test Fixture. In ECS Transactions, 78, 1047-1054. Pennington, New Jersey:Electrochemical Society. PNNL-SA-131556. doi:10.1149/07801.1047ecst