May 1, 1999
Journal Article

Mass Spectroscopy of Recoiled Ions, Secondary Ion Mass Spectroscopy, and Auger Electron Spectroscopy Investigation of Y2O3-Stabilized ZrO2(100* and (110*

Abstract

Studies the (100) and (110) surfaces of yttria-stabilized cubic ZrO2, using Auger electron spectrosocpy (AES), low energy electron diffraction (LEED), direct recoil spectrosocpy (DRS), mass-spectrosocpy of recoiled ions (MSRI), and secondary ion mass spectrosocpy (SIMS). Results show that yttria-stabilized cubic ZrO2 surfaces may not be suitable for detailed studies on molecular level surface interactions.

Revised: November 11, 2002 | Published: May 1, 1999

Citation

Herman G.S., M.A. Henderson, K.A. Starkweather, and E.P. Mcdaniel. 1999. Mass Spectroscopy of Recoiled Ions, Secondary Ion Mass Spectroscopy, and Auger Electron Spectroscopy Investigation of Y2O3-Stabilized ZrO2(100* and (110*. Journal of Vacuum Science and Technology A--Vacuum, Surfaces and Films 17, no. 3:939-944. PNNL-SA-30232.