February 6, 2007
Journal Article

Improving Surface Analysis Methods for Characterization of Advanced Materials by development of standards, reference data, and interlaboratory comparisons

Abstract

This paper summarizes the results of two surveys examining current needs for improved analyses of surfaces. Surfaces and interfaces are increasingly important to science and to technologies associated with nanoparticles, nano-structured materials and other complex materials including those associated with information systems and medical or biological applications. Adequate characterization of advanced materials frequently requires application of more than one analysis method along with the need to analyze data in increasingly sophisticated and sometimes interrelated ways. It is useful for both new and experienced analysts to have ready access to best practices for obtaining accurate and useful information from a variety of different analysis tools. The International Organization for Standardization (ISO) Committee TC 201 on Surface Chemical Analysis and ASTM Committee E-42 on Surface Analysis are working to address these needs by assembling guides and standards reflecting the collective experience and wisdom of experts in this community.

Revised: May 2, 2007 | Published: February 6, 2007

Citation

Baer D.R. 2007. Improving Surface Analysis Methods for Characterization of Advanced Materials by development of standards, reference data, and interlaboratory comparisons. Surface and Interface Analysis 39, no. 4:283-293. PNNL-SA-50907. doi:10.1002/sia.2508