February 15, 2016
Journal Article

Growth mechanisms and origin of localized surface plasmon resonance coupled exciton effects in Cu2_xS thin films

Abstract

Cu2-xS thin films prepared by template free single step wet chemical method on fluorine doped tin oxide substrate without any surfactant exhibts localized surface plasmon resonance (LSPR) coupled exciton effects. Cu2-xS thin films of unique surface morphology and free carrier density due to copper vacancy is controlled by the growth temperature and time. These selectively grown Cu2-xS thin films possess tunable band gap (2.6 - 1.4 eV) due to quantum size effect. Eventhough, all the samples show satellite peak in the X-ray photoelectron spectra due to Cu vacancies, only the samples with higher oxygen concentration show LSPR in the near infrared region.

Revised: March 16, 2016 | Published: February 15, 2016

Citation

Savariraj D.A., H. Kim, K.K. Viswanathan, M. Vijayakumar, and K. Prabakar. 2016. Growth mechanisms and origin of localized surface plasmon resonance coupled exciton effects in Cu2_xS thin films. RSC Advances 6, no. 23:19034-19040. PNNL-SA-114203. doi:10.1039/C5RA26744G