We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 250 nm resolution in the scanning directions and 1 µm resolution in depth) at depths of up to 35 µm deep normal to the surface. We find very little crystal strain (
Revised: April 4, 2008 |
Published: September 21, 2007
Citation
Miller E.A., M. Toloczko, A. Seifert, C.E. Seifert, W. Liu, and M. Bliss. 2007.Differential Aperture X-ray Microscopy Near Te Precipitates in CdZnTe. In Hard X-Ray and Gamma-Ray Detector Physics IX, Proceedings of SPIE, edited by Ralph B. James, Arnold Burger, Larry A. Franks, 6706, paper #670609. Bellingham, Washington:Society of Photo-optical Instrumentation Engineers.PNNL-SA-56432.doi:10.1117/12.738959