Instrument

JEOL JSM-IT200LA Scanning Electron Microscope

Located in PSL | Stewarded by Jiangtao Hu and Lorraine Seymour, Battery Materials & Systems Group

JEOL JSM-IT200LA SEM

Andrea Starr | Pacific Northwest National Laboratory

Mission

The JEOL JSM-IT200LA Scanning Electron Microscope (SEM) provides high-resolution and high-throughput microstructural characterization support to PNNL’s battery materials science research. This instrument can be used on non-dispersible materials with permission from the instrument stewards. 

Features

  • In high vacuum mode, has potential resolution of 3 nm at 30 kV, 8 nm at 3 kV and 15 nm at 1 kV. In low vacuum mode, the resolution is 4 nm at 30 kV.  
  • Includes both an Everhart-Thornley type secondary electron detector as well as a high sensitivity, multi-element, solid state backscatter electron (BSE) detector. The JEOL BSE detector is optimized for a 10 mm working distance for EDS and low voltage or high-resolution imaging. Equipped with a JEOL JED-2300 Dry silicon drift type EDS detector with 25 mm2 active area, which is interfaced with JEOL’s basic SEM and EDS microanalysis software.