Instrument
Tecnai F20
Located in the Physical Sciences Laboratory | Stewarded by Dongsheng Li
United States
Mission:
The Tecnai F20 microscope is a field emission 200 kV scanning transmission electron microscope (TEM) with a super TWIN objective lens and high brightness field emission electron gun optimized for analytical work.
Features:
- Objective lens allows a +/-35 degree tilt with a standard low-background double tilt holder and, with the tomography holder, allows +/-65 degrees of tilt.
- Equipped with energy dispersive analysis of X-rays and a silicon drift detector with resolution of 129 eV or better.
- Super ultra-thin window and windowless versions provide superior light element performance.
- Uniquely designed 30 mm2 silicon drift energy dispersive X- ray detector chip optimized for solid angle.
- Direct detection device camera provides up to 160 fps tempol resolution for in-situ TEM.
- Gas supply system available for in-situ environmental TEM operation.
- Various techniques are integrated into the instrument software for ease of operation.