Titanium oxides were grown anodically to selected final potentials on grade II polycrystalline
titanium under different anodization rates. XPS and RBS results show that the oxide consists of
primarily TiO2 with a non-stoichiometric oxide/metal interface, with the slower growth rate associated with a thicker layer at the interface. Characterization using TEM reveals that the
structure of the oxide evolves from a primarily amorphous phase to islands of crystallites in an
amorphous matrix, to an entirely crystalline phase by increasing the polarization potential.
Slower growth rates tend to remain crystalline at higher potentials. The mechanical strength of
oxide films extracted from load-depth data by nanoindentation varies dramatically for oxide
films grown by different rates at 9.4 V, and to a lesser extent at lower potentials. The variation of
film strength is associated with both compositional and structural characteristics.
Revised: April 7, 2011 |
Published: January 1, 2001
Citation
Pang M., D.E. Eakins, M.G. Norton, and D.F. Bahr. 2001.Relationships between Film Chemistry, Structure, and Mechanical Properties in Titanium Oxide. In Structure Property Relationships of Oxide Surfaces and Interfaces, Proceedings of the Materials Research Society Symposium, 654, AA3.41.1-AA3.41.6. Warrendale, Pennsylvania:Materials Research Society.