PNNL

Abstract

A state-of-the-art mid-infrared prism coupler was used to study the refractive index properties of forward-looking-infrared (FLIR) grade zinc sulfide samples prepared with unique planar grain orientations and locations with respect to the CVD growth axis. This study was motivated by prior photoluminescence and x-ray diffraction measurements that suggested refractive index may vary according to grain orientation. Measurements were conducted to provide optical dispersion and thermal index (dn/dT) data at discrete laser wavelengths (?) between 0.633 and 10.591 µm at two temperature set points (30 °C and 90 °C). Refractive index measurements between samples exhibited an average standard deviation comparable to the uncertainty of the prism coupler measurement (0.0004 refractive index units), suggesting that the variation in refractive index as a function of planar grain orientation and CVD deposition time is negligible, and should have no impact on subsequent optical designs. Measured dispersion data at mid-infrared wavelengths was found to agree well with prior published measurements.