Over the past three decade the use of XPS in research and publications has grown to make XPS the most widely used surface analysis method. Associated with the increased use there is an increase in new or inexperienced users along with a increase in erroneous and misapplications of the method. This article is the first in a series of guides and tutorials assembled by a committee of experienced practitioners intended to assist inexperienced users by sharing information about good practices in the use of XPS. This first guide identifies some sources of information for learning how to conduct XPS studies and examines the types of questions to be asked when determining if XPS is an appropriate technique to provide the needed or desired information. Many of the topics/questions addressed in this article apply to the other surface analysis techniques as well.
Revised: November 30, 2020 |
Published: May 1, 2019
Citation
Baer D.R., K. Artyushkova, C.R. Brundle, J. Castle, M.H. Engelhard, K.J. Gaskell, and J.T. Grant, et al. 2019.Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements.Journal of Vacuum Science & Technology A: International Journal Devoted to Vacuum, Surfaces, and Films 37, no. 3:Article number 031401.PNNL-SA-137067.doi:10.1116/1.5065501