PNNL

Abstract

In 2002, the Microscopy Society of America (MSA) launched a new initiative: “Focused Interest Groups” (FIGs). The FIGs were designed to promote the science of microscopy and microanalysis, increase participation at the annual Microscopy and Microanalysis (M&M) meeting, enhance collaboration and idea-sharing between microscopy and microanalysis disciplines, and increase interactions between microscopists at all career stages. In the last 20 years, several FIGs have exceeded this initial charter by formulating shared databases, developing important field standards, hosting external workshops and tutorials, and organizing Pre-Meeting Congresses, Sunday Short Courses, Symposia, and social events at the annual M&M meeting. Because these FIGs have proven to be powerful networking resources and helpful career accelerators, this is the beginning of a series of articles designed to introduce you to the different FIGs and let you know how you can get involved, too. Two of the oldest and most interconnected FIGs are the “Atom Probe Field Ion Microscopy” (APFIM) FIG, which is currently chaired by Daniel Perea, and the “Focused Ion Beam” (FIB) FIG, which is currently chaired by K.D. Derr. These two communities are closely affiliated because most atom probe tomography (APT) experiments require needle-shaped samples prepared using a FIB instrument. Both FIGs are individually and collaboratively responsible for continuously investigating new techniques and informing members about cutting-edge hardware and software developments that are impacting research groups within these scientific disciplines.