XAS and XRD Characterization of Annealed Pu-doped Zircon

October 6, 1999

Conference Paper

XAS and XRD Characterization of Annealed Pu-doped Zircon

Abstract

There is no abstract currently available for this item.

Revised: September 20, 2002 | Published: October 6, 1999

Citation

Begg B.D., N.J. Hess, and W.J. Weber. 1999. XAS and XRD Characterization of Annealed Pu-doped Zircon. In HLW and Pu Immobilization, INIS-FR--150, edited by C. Meis, 21-22. Saclay, :Commissariat a l'Energie Atomique. PNNL-SA-31213.