August 27, 2007
Journal Article

Variation in lattice parameters of 6H-SiC irradiated to extremely low doses

Abstract

Irradiation of 6H-SiC single crystals was performed using 4 MeV H+ ions at 340 and 210 K. The changes in lattice parameters in the basal plane and along the c-axes were measured as a function of dose using high-resolution x-ray diffraction. The c-axis lattice parameter increases monotonically with the increasing dose, while a-axis lattice parameter decreases at extremely low doses. An initial volumetric contraction of the unit cell is observed. The decrease in the a parameter may originate from the irradiation-induced vacancies and the possible formation of antisite defects that cause the lattice structure on the basal plane to shrink.

Revised: September 7, 2007 | Published: August 27, 2007

Citation

Jiang W., P. Nachimuthu, W.J. Weber, and L. Ginzbursky. 2007. Variation in lattice parameters of 6H-SiC irradiated to extremely low doses. Applied Physics Letters 91, no. 9:091918, 1-3. PNNL-SA-56153. doi:10.1063/1.2778630