We report the XPS characterization of a thermally evaporated iron thin film (6 nm) deposited on an Si/SiO_2/Al_2O_3 substrate using Al Ka X-rays. An XPS survey spectrum, narrow Fe 2p scan, narrow O 1s, and valence band scan are shown.
Revised: September 19, 2013 |
Published: September 6, 2013
Citation
Madaan N., S.S. Kanyal, D.S. Jensen, M.A. Vail, A. Dadson, M.H. Engelhard, and M.R. Linford. 2013.Thermally Evaporated Iron (Oxide) on an Alumina Barrier Layer, by XPS.Surface Science Spectra 20, no. 1:Article No. 49.PNNL-SA-95243.doi:10.1116/11.20121104