Herein we show characterization of an Fe thin film on Al_2O_3 after thermal annealing under H_2 using Al Ka X-rays. The XPS survey spectrum, narrow Fe 2p scan, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al_2O_3 film during Fe nanoparticle formation.
Revised: September 19, 2013 |
Published: September 6, 2013
Citation
Madaan N., S.S. Kanyal, D.S. Jensen, M.A. Vail, A. Dadson, M.H. Engelhard, and M.R. Linford. 2013.Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS.Surface Science Spectra 20, no. 1:Article No. 55.PNNL-SA-95255.doi:10.1116/11.20121105