July 5, 2023
Conference Paper

Spectral gratings-based phase-contrast imaging for materials characterization

Abstract

Spectral X-ray detectors provide a direct observation of the energy spectrum of a transmitted X-ray beam, both for typical and phase-contrast gratings-based systems. The sensitivity of a gratings-based X-ray system to small-angle deflections from a given particle size is dependent on X-ray energy. Therefore, spectral (energy-sensitive) detectors could be sensitive to particle size, even with a broad spectrum from a commercial X-ray generator. Furthermore, these detectors allow direct observation of how the X-ray spectrum is changing as the beam is passing through an object and gratings, and how this affects grating visibilities used to determine the presence of small-angle deflections. This is a particular issue for higher-energy systems where artifacts from beam hardening are common. We present results exploring the particle-size dependent signatures that are available from a spectral gratings-based phase-contrast X-ray imaging system, and the feasibility of observing them with lab-based, broad-spectrum X-ray generators.

Published: July 5, 2023

Citation

Gilbert A.J., A.C. Denny, A.N. Sarceno, R.S. Wittman, and E.A. Miller. 2023. Spectral gratings-based phase-contrast imaging for materials characterization. In Anomaly Detection and Imaging with X-Rays (ADIX) VIII, April 30- May 5, 2023, Orlando, FL. Proceedings of the SPIE, edited by A. Ashok, J.A. Greenberg, and M.E. Gehm, 12531, Art. No. 125310G. Bellingham, Washington:SPIE. PNNL-SA-183391. doi:10.1117/12.2663669

Research topics