A prototype regenerative feedback resonant circuit has been developed for measuring the transient spectral response due to perturbations in properties of various electromagnetic materials. The circuit can accommodate a variety of cavity resonators, shown here in the 8 GHz range, with passive quality factors (Qstat) as high as 7,000 depending upon material loading. The positive feedback enhanced dynamic quality factors (Qdyn) of resonator/material combinations in the regenerative circuit are on the order of 107 - 108. The theory, design, and implementation of the circuit is discussed along with real-time monitored example measurements of effects due to photon-induced charge carriers in high-resistivity silicon wafers and magnetic-field induced perturbations of yttrium-iron garnet.
Revised: August 26, 2013 |
Published: August 8, 2013
Citation
Jones A.M., J.F. Kelly, R.H. Severtsen, and J.S. McCloy. 2013.Regenerative Feedback Resonant Circuit to Detect Transient Changes in Electromagnetic Properties of Semi-Insulating Materials.Review of Scientific Instruments 84, no. 8:Article No. 084703.PNNL-SA-93493.doi:10.1063/1.4817537