Using a thin amorphous layer of SiO2 (5.2 mg/cm2) on Si, cross sections for the nuclear reactions 16O(d,p1)17O, 16O(d,a)14N and 16O(a,a)16O at a laboratory angle of 150° are determined over energies ranging from 0.70 to 1.06 MeV for D? ions and from 2.95 to 3.05 MeV for He? ions. The results are plotted and tabulated as a function of ion energy. An example for the analysis of atomic displacements on the O sublattice in a Au2?-irradiated SrTiO3 single crystal is given
Revised: May 20, 2004 |
Published: August 1, 2003
Citation
Jiang W., V. Shutthanandan, S. Thevuthasan, D.E. McCready, and W.J. Weber. 2003.Oxygen Analysis Using Energetic Ion Beams.Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms 207, no. 4:453-461.PNNL-SA-37676.