April 1, 2009
Conference Paper

Low Cost Plane Parallel Plate Lateral Shearing Interferometer for Infrared Laser Beam Diagnostics

Abstract

In this paper we present and demonstrate, through laboratory measurements and computer ray tracing simulations, a low-cost Lateral Shearing Interferometer (LSI) use to measure the collimation and wave front quality of infrared lasers. The LSI is constructed using a single commercial off-the-shelf uncoated ZnSe window in conjunction with an infrared camera.

Revised: June 28, 2010 | Published: April 1, 2009

Citation

Bernacki B.E., K. Krishnaswami, and N.C. Anheier. 2009. Low Cost Plane Parallel Plate Lateral Shearing Interferometer for Infrared Laser Beam Diagnostics. In SPIE, edited by Mark Dubinskii, Stephen G. Post, 7325, Art. No. 73250X-1 - 73250X-10. Bellingham, Washington:Laser Technology for Defense and Security V. PNNL-SA-65241. doi:10.1117/12.817416